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全球光谱质谱届极负盛名的大咖级人物、ICP-MS发明人之一、美国爱荷华州立大学博士导师、美国Ames国家实验室**科学家——Robert Samuel Houk教授将于今年十月访问中国并带来高级别的学术报告。
R.S.Houk教授在ICP质谱仪器设计和应用领域耕耘了几十年，取得过耀眼的成就。他是发表ICP-MS仪器领域文章的**人，此后陆续在各种权威杂志上发表了
两百多篇相关论文，并在化学界获奖无数：
美国化学会光谱化学奖（ACS Award for Spectrochemical 2012）
分析化学奖（Anachem Award, Association for Analytical Chemistry 2000）(affiliated with ACS Detroit Section)
美国化学会化学仪器奖（ACS Award for Chemical Instrumentation 1993）；
匹兹堡大会Maurice F. Hasler奖，该奖项表彰“对光谱学领域的重大贡献，导致广泛用途的应用”（1993） （Maurice F. Hasler Award from Spectroscopy Society of Pittsburgh and Fisons (1993). This award recognizes "significant contributions to the field of spectroscopy that have resulted in applications of broad utility."）
美国应用光谱Lester W. Strock 奖（Co-recipient, Lester W. Strock Award from Society for Applied Spectroscopy (1986) ）
美国分析化学杂志60篇最有影响力原创文章（Original ICP-MS paper chosen to be reprinted as “one of the 60 most influential papers published in the journal Analytical Chemistry," （1994））
R．S．Houk教授任职美国爱荷华州立大学教授和美国能源部欧姆斯国家实验室**科学家（Ames Lab）的同时，还担任过：
美国质谱学会杂志副主编（Associate Editor, Journal of the American Society for Mass Spectrometry (1989-1994)）；
质谱百科全书——无机质谱卷编辑（Volume Editor, Inorganic Mass Spectrometry, Encyclopedia of Mass Spectrometry, 2002-2008）
光谱化学编辑顾问委员会委员（Editorial Advisory Board, Spectrochimica Acta, Part B (1989-present)）
原子光谱分析期刊编辑顾问委员会委员（Editorial Advisory Board, Journal of Analytical Atomic Spectrometry (1995-2005)）
日本钢铁研究所期刊编辑顾问委员会委员（Editorial Advisory Board, Journal of the Iron & Steel Institute of Japan, (2000-2006)）
美国质谱学会元素分析兴趣小组主席（Chairman, Elemental Analysis Interest Group, American Society for Mass Spectrometry (1990-1994)）。
R．S．Houk教授的导师更是大名鼎鼎的ICP光谱之父V. A. Fassel法赛尔教授， Fassel是ICP光谱的发明人，他明确定义了上千条可应用的光谱谱线，他的贡献极大地促进了光谱化学的发展和进步，是国际化学界公认的杰出科学家， 曾获美国应用光谱学会奖、匹兹堡光谱学会奖 、美国化学会分析化学奖、化学仪器仪表奖̷̷
这师徒二人的成就造就了**ICP光谱和ICP-MS成为分析化学中普遍且主要的无机分析应用手段。R.S.Houk教授将于十月来华访问，届时会有一系列高级别的学术报告呈现，饕餮盛宴敬请期待！
Agenda
Professor Robert S. Houk Beijing Visiting
Date
Agenda
Oct. 9
Monday
Attend BCEIA: Technique section, key note speaker at Mass Spectrometry section
25min talk
Topic: MASS SPECTROMETRY FROM ATOMS TO METABOLITES
Oct. 11
Wednesday
Morning Seminar organized by LABOR PRAXIS.at BCEIA
30min talk
Topic: Sample preparation and introduction for Mass Spectrometry
Night: Reception, Welcome Professor R.S.Houk and LabTech 15years
Short speech, Penal discussion with top scientist: 30min
Oct. 13
Friday
Share the experience with LabTech Beijing people and Visit LabTech facility
Topic: First ICP-MS paper and ICP-MS instrument
更详细的资讯将随后发布！
附Robert Samuel Houk教授简历如下，感兴趣的朋友可以深入了解。
PROFESSIONAL BIOGRAPHY
ROBERT SAMUEL HOUK
1. EDUCATION
College
Undergraduate B.S., Slippery Rock State College 1974
Slippery Rock, Pennsylvania
B.S. summa cum laude
in Secondary Education
(Chemistry specialization)
Graduate Ph.D., Iowa State University 1980
in analytical chemistry
Major Professors V. A. Fassel and H. J. Svec
Dissertation Title An Inductively Coupled Plasma
as an Ion Source for the
Determination of Trace Elements
in Solutions by Mass Spectrometry
2. PROFESSIONAL EXPERIENCE
Assistant Chemist II, Ames Laboratory-USDOE, Iowa State University
February 1980-July 1981.
Assistant Professor of Chemistry and Associate Chemist,
Ames Laboratory, Iowa State University, July 1, 1981 - June 30, 1987.
Associate Professor of Chemistry and Chemist, Ames Laboratory,
July 1, 1987 - June 30, 1991.
Professor of Chemistry and Senior Chemist, Ames Laboratory,
July 1, 1991 - present.
3. HONORS, AWARDS AND PROFESSIONAL SOCIETIES Selected
ACS Award for Spectrochemical Analysis, Aug 2012
Fellow, Society for Applied Spectroscopy (2007)
Anachem Award, Association for Analytical Chemistry (affiliated with ACS Detroit Section), Detroit MI (2000). Previous winners include H. Diehl and V. A. Fassel.
ACS Award for Chemical Instrumentation (1993)
Maurice F. Hasler Award from Spectroscopy Society of Pittsburgh and Fisons (1993). This award recognizes "significant contributions to the field of spectroscopy that have resulted in applications of broad utility."
Co-recipient, Lester W. Strock Award from Society for Applied Spectroscopy (1986)
Original ICP-MS paper chosen to be reprinted as “one of the 60 most influential papers published in the journal Analytical Chemistry," 1994
Associate Editor, Journal of the American Society for Mass Spectrometry (1989-1994)
Guest Editor, V. A. Fassel Memorial Issue, Spectrochimica Acta, Part B (2000-01)
Volume Editor, Inorganic Mass Spectrometry, Encyclopedia of Mass Spectrometry, 2002-2008
Editorial Advisory Board, Spectrochimica Acta, Part B (1989-present)
Editorial Advisory Board, Journal of Analytical Atomic Spectrometry (1995-2005)
Editorial Advisory Board, Journal of the Iron & Steel Institute of Japan, (2000-2006)
Chairman, Elemental Analysis Interest Group, American Society for Mass Spectrometry (1990-1994)
4. RESEARCH INTERESTS
Development and fundamental study of ionization techniques for analytical mass
spectrometry, including inductively coupled plasmas, lasers, and electrospray ionization.
Development of “soft” ionization techniques for identification of inorganic ions and
complexes.
Diagnostic studies of excitation, ionization, and energy transfer mechanisms in
inductively coupled plasmas.
Novel techniques for observing optical radiation from inductively coupled plasmas.
Advanced techniques for time-of-flight mass spectrometry, ion traps, high resolution
mass spectrometry, and ion implantation.
Chromatographic and spectroscopic techniques for measurement of elemental
speciation.
Ion mobility, ion-ion reactions, top-down “xxx-omics,” multiple stage tandem MS
MS of plant metabolites, atmospheric pressure MALDI
5. CONTRIBUTED PAPERS
1. "Evaluation of an Inductively Coupled Argon Plasma Operated at Atmospheric Pressure as an Ion Source for Analytical Mass Spectroscopy", 6th Annual Meeting of the Federation of Analytical Chemistry and Spectroscopy Societies, Philadelphia, PA, September 1979 (Paper No. 51).
Too many contributed papers, quit counting in 1991.
6. INVITED LECTURES
1. "Analytical Capabilities of ICP-MS", EPA Review Symposium, Athens, GA, March 1979.
More than 300 invited lectures have been given.
7. LIST OF PUBLICATIONS
1. R. S. Houk, V. A. Fassel, G. D. Flesch, H. J. Svec, A. L. Gray and C. E. Taylor, "Inductively Coupled Argon Plasma as an Ion Source for Mass Spectrometric Determination of Trace Elements", Anal. Chem. 52, 2283-2289 (1980). This paper named winner of 1986 Lester W. Strock Award.
2. R. S. Houk, V. A. Fassel and H. J. Svec, "Inductively Coupled Plasma - Mass Spectrometry: Sample Introduction, Ionization, Ion Extraction, and Analytical Results" in Dynamic Mass Spectrometry; D. Price and J. F. J. Todd, Eds.; Heyden: London, 1981; Vol. 6, Chapter 19, pp. 234-251.
3. R. S. Houk, H. J. Svec and V. A. Fassel, "Mass Spectrometric Evidence for Suprathermal Ionization in an Inductively Coupled Argon Plasma", Appl. Spectrosc. 35, 380-384 (1981).
4. R. S. Houk, V. A. Fassel and H. J. Svec, "Mass Spectra of Polar Organic Compounds in Aqueous Solutions Introduced into an Inductively Coupled Plasma", Org. Mass. Spectrom. 17, 240-244 (1982).
5. R. S. Houk and J. J. Thompson, "Elemental and Isotopic Analysis of Solutions by Mass Spectrometry Using a Plasma Ion Source", American Mineralogist 67, 238-243 (1982).
6. R. S. Houk and J. J. Thompson, "Trace Metal Isotopic Analysis of Microliter Solution Volumes by Inductively Coupled Plasma Mass Spectrometry", Biomed. Mass Spectrom. 1983, 10, 107-112.
69. H. Niu, K. Hu and R. S. Houk, "Langmuir Probe Measurements of Electron Temperature and Electron Density Behind the Skimmer of an ICP-MS," Spectrochim. Acta B 1991, 46B, 805-817.
77. K. Hu, P. S. Clemons and R. S. Houk, "Analytical Characteristics of a New, Offset Ion Lens for ICP-MS. I. Ion Trajectories and Detector Performance," J. Amer. Soc. Mass Spectrom. 1993, 4, 16-27.
78. K. Hu and R. S. Houk, "Analytical Characteristics of a New, Offset Ion Lens for ICP-MS. II. Reduction of Polyatomic Ion Interferences and Matrix Effects," J. Amer. Soc. Mass Spectrom. 1993, 4, 28-37.
80. K. Hu and R. S. Houk, "ICP-MS with an Electrically Floating Interface," J. Amer. Soc. Mass Spectrom., 1993, 4, 733-741.
98. K. Hu and R. S. Houk, "Ion Deposition by ICP-MS," J. Vac. Sci. Technol. A. 1996,
14, 370-373.
173. A. Jesche, R. W. McCallum, S. Thimmaiah, J. L. Jacobs, V. Talfour, A. Kreyssig,
R. S. Houk, S. L. Bud’ko, P. C. Canfield, Giant Magnetic Anisotropy and Tunneling of the Magnetization in Li2(Li1-xFex)N, Nature Comms. 2014 doi 10.1038/ncomms4333.
174. B. Hattendorf, B. Gusmini, L. Dorta, R. S. Houk, D. Guenther, Mass Spectrometric Observation of Doubly Charged Alkaline Earth – Argon Ions, ChemPhysChem 2016, 17, 2640-44.
175. B. Hattendorf, B. Gusmini, L. Dorta, R. S. Houk, D. Guenther, Abundance and Impact of Doubly Charged Polyatomic Argon Interferences in ICP-MS S[ectra, Anal. Chem. 2016, 88, 7281-7288.
̷̷
8. RECENT RESEARCH
Analytical Mass Spectrometry
Molecular Processes Program
Laser Ablation ICP-MS for Profiling Solids as Evidence
improve analytical figures of merit of laser ablation ICP-MS for direct analysis of solids.
The Origins of Polyatomic Ions in ICP-MS
NSF, Analytical and Surface Chemistry Program
Elemental Analysis of Automobile Putty for Forensic Purposes
Midwest Forensic Research Center
Mass Spectrometric Imaging of Plant Metabolites
investigate imaging possibilities with high-pressure MALDI
High Resolution MS with a Multiple Pass Quadrupole MS for Nuclear Applications
Trace Element Contents of Garnet and Gahnite as Guides in the Exploration for
Metamorphosed Copper-Lead-Zinc-Silver-Gold Deposits
by Laser-Ablation ICP-MS
Phosphorylation in Proteins
Plant Sciences Institute, ISU
High Spectral Resolution with a Multiple Pass Quadrupole Mass Analyzer
ICP-MS for Analysis of Microliter Samples and Solids
Office of Technology Development
Measurement of Radionuclides and Trace Element Speciation by Electrospray Mass
Spectrometry
