原子力Ambient AFM/MFM 显微镜

Ambient AFM/MFM 原子力显微镜
上海伯东代理英国 NanoMagnetics AFM - 原子力显微镜, 高精度和高分辨率使其可以分析许多不同样品, AFM - 原子力显微镜可以在液体或空气中测量. 手动校准, 采用白光 LED, 亮度可调, 视野更佳. Z 噪音降至25 fm/ Hz.
Ambient AFM/MFM 原子力显微镜系统参数
标准扫描模式
Intermittent Contact / Phase Contrast
Contact
Non-contact
Lateral Force
MFM
EFM
(Any single mode standard, additional modes may be
added as options.)
可选扫描模式
Scanning Tunneling Microscope (STM)
Piezo Response Force Microscope (PrFM)
Kelvin Probe Force Microscope (KPFM)
Scanning Spreading Resistance Microscope (SSRM)
Conductive AFM
Capacitance Force Microscopy (CFM)
Force Modulation Microscopy (FMM)
AFM Spectroscopies
Nanoindentation
Nanolitography
Maximum Z Resolution
0.03nm with 100 mx100 m scanner
0.01nm with 40 mx40 m scanner
0.005nm with 4 mx4 m scanner
Static/Dynamic RMS Cantilever Z Noise
25fm Hz noise floor with laser RF modulation
Scan Range
4x4x2 m or 40x40x4 m or 100x100x8 m
STM Current Range
1pA-10nA, 10fA / Hz noise floor
Maximum Sample Size/Height
30x30x10 mm
Approach
Software controlled
Motorized
50 mm range with 250 nm sensivity
Camera
CCD analog colour camera
Camera Resolution
2 m
Light Source for Optical Microscope
White LED, adjustable from software
Signal Processing
16 bit ADCs / 24 bit DACs
Digital feedback with FPGA / DSP
Simultaneous scan of 16 channels
up to 4096x4096 pixels
Cantilevers
All of the commercial cantilevers can be used
Acoustic and Vibration Isolation
Multilayer acoustic enclosure 180 access
0.3Hz passive vibration isolation table

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